In this work we present influence of the thickness of top electrode on inverted planar heterojunction perovskite CH3NH3PbI3-xClx solar cell degradation. Perovskite solar cells with structure ITO/PEDOT:PSS/CH3NH3PbI3-xClx/PCBM/C60/Ag were built. Perovskite layer was deposited on PEDOT:PSS layer using modified interdiffusion method [1] from PbI2+PbCl2 (with molar ratio 3,4) solution in mixture of DMF+DMSO (molar ratio 3). As hole transporting material we choose double fullerene layer: soluble fullerene derivative PCBM covered in vacuum by C60 layer. As top electrode we used thermally evaporated Ag with different thicknesses (50 and 100 nm). It was shown that increase of Ag layer thickness diminishes cell initial degradation in air. All photoelectric measurements have been made in the same homemade vacuum cryostat where electrode was deposited at p~5∙10-7 mbar without breaking the vacuum and moving the cell.