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Publikācija: Accelerated Life Testing in Reliability Evaluation of Power Electronics Assemblies

Publication Type Full-text conference paper published in other conference proceedings
Funding for basic activity State funding for education
Defending: ,
Publication language English (en)
Title in original language Accelerated Life Testing in Reliability Evaluation of Power Electronics Assemblies
Field of research 2. Engineering and technology
Sub-field of research 2.2 Electrical engineering, Electronic engineering, Information and communication engineering
Research platform None
Authors Oskars Bormanis
Leonīds Ribickis
Keywords Reliability engineering, Electronic equipment manufacture, Electronic equipment testing
Abstract Reliability tests for assessment of service life in power electronics product lifecycle are investigated. Paper reviews basic principles of highly accelerated life test and multiple environment over stress tests. Failure types revealed during the accelerated life tests are discussed as well as practical examples of the tests from industry.
DOI: 10.1109/RTUCON.2018.8659911
Hyperlink: https://ieeexplore.ieee.org/document/8659911 
Reference Bormanis, O., Ribickis, L. Accelerated Life Testing in Reliability Evaluation of Power Electronics Assemblies. In: 2018 IEEE 59th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON 2018): Proceedings, Latvia, Riga, 12-14 November, 2018. Piscataway: IEEE, 2018, pp.195-199. ISBN 978-1-5386-6904-4. e-ISBN 978-1-5386-6903-7. Available from: doi:10.1109/RTUCON.2018.8659911
ID 27692