Investigation Of Mechanism Of Radiation Defects Generation And Redistribution In Semiconductors
2008
Artūrs Medvids, Dainis Grabovskis, Pēteris Gavars, Pāvels Onufrijevs, Edvīns Daukšta

Defects engineering has shown that intrinsic defects in semiconductor devices have not only negative function, but also positive. Experiments have shown a possibility to form p-n junction at a surface ofi-type semiconductor by laser radiation. Summarising the experimental results, the model of laser radiation interaction with i- type semiconductor is developed. The main role in p-n junction formation is to high gradient of temperature, as a result interstitial atoms and vacancies drift opposite directions: vacancies into semiconductor bulk, but interstitial atoms to the surface. Vacancies have positive charge, but interstitial atoms have negative one, thereby, p-n junction is formed. The model was proved by Volt-Ampere characteristics measurement method.


Keywords
radiācijas defekti, lāzers, pusvadītāji

Medvids, A., Grabovskis, D., Gavars, P., Onufrijevs, P., Daukšta, E. Investigation Of Mechanism Of Radiation Defects Generation And Redistribution In Semiconductors. Materials Sciences and Applied Chemistry. Vol.16, 2008, pp.70-75. ISSN 1407-7353.

Publication language
Latvian (lv)
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