Probing Light-Induced Surface Charge Kinetics Using Kelvin Probe Force Microscopy in a Non-Imaging Mode

23rd International Conference-School "Advanced Materials and Technologies": Book of Abstracts 2021
Jurijs Dehtjars, Hiran Chanaka Gunawardana Maladenige, Hermanis Sorokins

Substrate surface electric potential caused by the presence of surface charge plays a critical role in cell adhesion. In this work, the setup for measuring the effects of light stimulation on surface charge kinetics using an atomic force microscope with KPFM measurement capacity is demonstrated.

Atslēgas vārdi
surface charge, electron traps, optical stimulation, AFM, KPFM

Dehtjars, J., Gunawardana Maladenige, H., Sorokins, H. Probing Light-Induced Surface Charge Kinetics Using Kelvin Probe Force Microscopy in a Non-Imaging Mode. No: 23rd International Conference-School "Advanced Materials and Technologies": Book of Abstracts, Lietuva, Palanga, 23.-27. augusts, 2021. Kaunas: Kaunas University of Technology, 2021, 39.-39.lpp. e-ISSN 2669-1930.

Publikācijas valoda
English (en)