Surface Characterization of Antireflective Thin Films

The 6th International Conference on Physical and Numerical Simulation of Materials Processing (ICPNS 2010): Proceedings 2010
Janīna Sētiņa, Gundars Mežinskis, Daina Andersone

Optical properties (refractive index, reflectance, transmission) were determined, and discussed in connection with surface morphology of films studied by means of atomic force microscopy (AFM). The surface roughness and anti-reflection index depends on film preparation conditions. The highest transmission (up to 96,1%) in the range of 200 to 1100 nm was obtained for both side four layers deposited glass samples. In order to clarify the influence of environmental conditions onto properties of coatings, samples were tested in cyclic corrosion chamber (CCC). Results of present study show that environmental factors do not change quality of film surface and light reflection.

Atslēgas vārdi
Anti-reflection film, surface properties, reflection, thickness of film

Sētiņa, J., Mežinskis, G., Andersone, D. Surface Characterization of Antireflective Thin Films . No: The 6th International Conference on Physical and Numerical Simulation of Materials Processing (ICPNS 2010): Proceedings, Ķīna, Guilin, 16.-19. novembris, 2010. Guilin: Guilin University of Electronic Technology, 2010, S42-1.-S42-6.lpp.

Publikācijas valoda
English (en)