Effect of XRD Data Collecting Parameters on Poorly Crystalline Material Difractogram

Latvijas Universitātes raksti. 762.sēj.: Zemes un vides zinātnes 2011
Agnese Stunda-Zujeva, Līga Bērziņa-Cimdiņa, Ilze Lūse, Valdis Segliņš

X-ray diffraction (XRD) nowadays is widely used method for qualitative and quantitative analysis of crystalline materials. Poorly crystalline materials give low peak intensities and background profile, but still these results can be used for analysis as well. The aim of this study is to detect effects of data collecting parameters on intensity, background hump and various peak parameters of XRD pattern. It was concluded that with optimal parameters (irradiated length, step and slits) quality of diffractogram can vary crucially. Therefore, before analysis of poorly crystalline materials one should set priorities which quality factors of diffractogram are most important in particular case.

Keywords
X-ray diffraction, powder, poorly crystalline, XRD data collecting, clay
Hyperlink
http://www.lu.lv/fileadmin/user_upload/lu_portal/apgads/PDF/LUR-762_Zemes_vides-zinatnes.pdf#page=93

Stunda-Zujeva, A., Bērziņa-Cimdiņa, L., Lūse, I., Segliņš, V. Effect of XRD Data Collecting Parameters on Poorly Crystalline Material Difractogram. In: Zemes un vides zinātnes: Latvijas Universitātes raksti. Rīga: Latvijas Universitāte, 2011, pp.93-101. ISBN 978-9984-45-324-8. ISSN 1407-2157.

Publication language
Latvian (lv)