Information about Author
Name, Surname:

T. Kärner

Publications
8 items found, displaying 1 to 8.
Stress Relaxation Mechanism by Strain in the Si-SiO2 System and Its Influence on the Interface Properties
(2011)
D. Kropman, E. Mellokov, T. Kärner, T. Laas, Artūrs Medvids, Pāvels Onufrijevs, Edvīns Daukšta
Scientific article indexed in SCOPUS or WOS database
Stresses Relaxation Mechanism in the Si-SiO2 System and Its Influence on the Interface Properties
(2011)
D. Kropman, E. Mellikov, T. Kärner, Artūrs Medvids, Pāvels Onufrijevs, Edvīns Daukšta
Conference paper
Stress Relaxation Mechanism by Strain in the Si-SiO2 System and Its Influence on the Interface
(2011)
D. Kropman, E. Mellikov, T. Kärner, Artūrs Medvids, Pāvels Onufrijevs, Edvīns Daukšta
Scientific article indexed in SCOPUS or WOS database
Interaction of Point Defects with Impurities in the Si-SiO2 System and Its Influence on the Properties of the Interface
(2010)
Daniel Kropman, E. Mellikov, K. Lott, T. Kärner, I. Heinmaa, Tony Laas, Artūrs Medvids, Wolfgang Skorupa, S. Prucnal, S. Zvyagin, E. Cizmar, M. Ozerov, J. Woznitsa
Publication (anonimusly reviewed) in a journal with an international editorial board indexed in other databases
Strain Relaxation Mechanism in the Si-SiO2 System and Its Influence on the Interface Properties
(2009)
Daniel Kropman, E. Mellikov, A. Opik, K. Lott, O. Volobueva, T. Kärner, I. Heinmaa, T. Laas, Artūrs Medvids
Publication (anonimusly reviewed) in a journal with an international editorial board indexed in other databases
Hydrogen Interaction with Point Defects in the Si-SiO2 Structures and Its Influence on the Interface Properties
(2008)
U. Abru, I. Heinmaa, T. Kärner, D. Kropman, T. Laas, Artūrs Medvids, E. Mellikov, U. Ugaste
Scientific article indexed in ERIH database, in INT1 or INT2 category journals
Strain Relaxation Mechanism in the Si-Sio2 System and Its Influence on the Interface Properties
(2008)
I Heinmaa, T. Kärner, D. Kropman, T. Laas, K. Lott, Artūrs Medvids, E. Mellikov, A. Opik, O. Volobueva
Full-text conference paper published in other conference proceedings
Impurities Interaction with Point Defects in the Si- SiO2 System and Its Influence on the Interface Properties
(2008)
I. Heinmaa, T. Kärner, D. Kropman, T. Laas, K. Lott, Artūrs Medvids, E. Mellikov, A. Opik
Conference paper

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